Defect Sizing Using Non-destructive Ultrasonic Testing: Applying Bandwidth-Dependent DAC and DGS Curves


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Descripci贸

This book presents a precise approach for defect sizing using ultrasonics. It describes an alternative to the current European and American standards by neglecting their limitations. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. It introduces an improved method which provides a significant productivity gain and calculates curves with high accuracy. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance amplitude correction (DAC) curves.

Detalls del producte

Editorial
Springer International Publishing AG
Data de publicaci贸
Idioma
Angl猫s
Tipus
R煤stica
EAN/UPC
9783319813790

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