Residual Stress Measurement by X-Ray Diffraction


This product is not available in the selected currency.

Descripci贸

This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available. The purpose of this revision is not to incorporate all of the research in the fields of x-ray and neutron diffraction but to focus on the practical applications of x-ray diffraction techniques useful to members of the automotive engineering related industries.

Detalls del producte

Editorial
SAE International
Data de publicaci贸
Idioma
Angl猫s
Tipus
R煤stica
EAN/UPC
9780768010695
Mat猫ries IBIC:

Obtingues ingressos recomanant llibres

Genera ingressos compartint enlla莽os dels teus llibres favorits a trav茅s del programa d鈥檃filiats.

Uneix-te al programa d鈥檃filiats