Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers


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Descripció

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Detalls del producte

Editorial
Elsevier Science Publishing Co Inc
Data de publicació
Idioma
Anglès
Tipus
Tapa dura
EAN/UPC
9780123859839
Matèries IBIC:

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